NAND beam aswell uses floating-gate transistors, but they are affiliated in a way that resembles a NAND gate: several transistors are affiliated in series, and alone if all chat curve are pulled top (above the transistors' VT) is the bit band pulled low. These groups are again affiliated via some added transistors to a NOR-style bit band array.
To read, a lot of of the chat curve are pulled up aloft the VT of a programmed bit, while one of them is pulled up to just over the VT of an asleep bit. The alternation accumulation will conduct (and cull the bit band low) if the called bit has not been programmed.
Despite the added transistors, the abridgement in arena affairs and bit curve allows a denser blueprint and greater accumulator accommodation per chip. In addition, NAND beam is about acceptable to accommodate a assertive bulk of faults (NOR flash, as is acclimated for a BIOS ROM, is accepted to be fault-free). Manufacturers try to aerate the bulk of accessible accumulator by shrinking the admeasurement of the transistor beneath the admeasurement area they can be fabricated reliably, to the admeasurement area added reductions would access the bulk of faults faster than it would access the absolute accumulator available
To read, a lot of of the chat curve are pulled up aloft the VT of a programmed bit, while one of them is pulled up to just over the VT of an asleep bit. The alternation accumulation will conduct (and cull the bit band low) if the called bit has not been programmed.
Despite the added transistors, the abridgement in arena affairs and bit curve allows a denser blueprint and greater accumulator accommodation per chip. In addition, NAND beam is about acceptable to accommodate a assertive bulk of faults (NOR flash, as is acclimated for a BIOS ROM, is accepted to be fault-free). Manufacturers try to aerate the bulk of accessible accumulator by shrinking the admeasurement of the transistor beneath the admeasurement area they can be fabricated reliably, to the admeasurement area added reductions would access the bulk of faults faster than it would access the absolute accumulator available
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